TEST SOLUTION

We provide the best solution to customers.

GigaLane is ready to introduce its unique test solutions for semiconductor & OLED panel and has been developing a test solution for 3DIC that is coming in the very near future.

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Probe Card

<DRAM Probe Card>

  • • Excellent Electrical Characteristic with PI on MLC
  • • High Pin Count
  • • Stable Mechanical Characteristic at Dual Temp.
  • • Automatic Pin Bonding

<DC Probe Card>

  • • Excellent Electrical Characteristic with PI on MLC
  • • High Pin Count
  • • Stable Mechanical Characteristic at Dual Temp.
  • • Automatic Pin Bonding

<System LSI Probe Card>

  • • Excellent Electrical Characteristic with PI on MLC
  • • High Pin Count
  • • Stable Mechanical Characteristic at Dual Temp.
  • • Automatic Pin Bonding

<CIS Probe Card>

  • • Excellent Electrical Characteristic with PI on MLC
  • • High Pin Count
  • • Stable Mechanical Characteristic at Dual Temp.
  • • Automatic Pin Bonding